We’re proud to announce the launch of our new OmniScan® X3 flaw detector at this year’s ASNT Annual Conference! Rugged, reliable, and IP65 certified, the OmniScan X3 unit offers advanced total focusing method/phased array imaging and an improved workflow. Its innovative acoustic influence map (AIM) modeling tool helps you ensure coverage of the region of interest for TFM inspections. These and other enhancements were designed to smooth the transition for current OmniScan users. Schedule a personalized demonstration our booth.